FEI introduces new scanning electron microscope

FEI, a leading provider of atomic-scale imaging and analysis systems, has released the QuantaTM 50 Series scanning electron microscope (SEM), which offers a combination of performance and versatility over a wide range of samples. “The new Quanta 50 Series is one of the most versatile SEMs currently available,” said Daniel Phifer, Product Marketing Manager, FEI. “It is designed as a multipurpose SEM for labs that require high-performance imaging for a broad range of samples, including those that are insulating, wet, dirty, or dynamically changing, in industries such as materials research, mineralogy, chemicals and petroleum, electronics, pharmaceuticals and biology. Unlike other SEMs, where the sample has to fit the instrument design, the unique Quanta 50 Series is designed to enable viewing of any sample in its natural state. [It] delivers powerful performance and flexibility, which enables it to remain a valuable investment as the needs of the lab change over time,” Phifer added. (more…)

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